TeraSpectra: A terahertz spectrometer

ARP’s Terahertz Spectrometer, TeraSpectra is a turn key spectrometer system, that allows time domain measurements to be conducted over a time span of sub-Pico seconds to a few tens of Pico-seconds with an equivalent frequency range of 0.1 to ~30 THz.

This wide range allows characterizing a number of molecular events important in semiconductor and nano-material research and inspection.

Parameter TeraSpectra

Time resolution ~33 Femto-seconds
Time span Up to 100 Pico-seconds
Fourier Transform Frequency Range 0.1 up to ~35 terahertz
Technology Next generation EO
dendrimer terahertz emitter
Source power >5 milliwatts, average
Sensitivity ~100 FemtoMol

Key Features

  • Turn-key System
  • 3-Dimensional Imaging
  • Sub-Surface Inspection
  • Non-Contact
  • Non-Destructive
  • Layer-by-Layer Analysis
  • Material Characterization:
    • Lattice Image
    • Stacking Fault
    • Dislocations
    • Nanovoids
    • Delamination